[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Write disturb analyses on half-selected cells of cross-point RRAM arrays
Li, Haitong, Chen, Hong-Yu, Chen, Zhe, Chen, Bing, Liu, Rui, Qiu, Gang, Huang, Peng, Zhang, Feifei, Zizhen Jiang,, Gao, Bin, Liu, Lifeng, Liu, Xiaoyan, Yu, Shimeng, Wong, H.-S. Philip, Kang, JinfengYear:
2014
Language:
english
DOI:
10.1109/irps.2014.6861158
File:
PDF, 256 KB
english, 2014