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[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - Test Challenge for Deep Sub-micron Era - Test & Diagnosis Platform: STARCAD-Clouseau
Aikyo, TakashiYear:
2010
Language:
english
DOI:
10.1109/dft.2010.34
File:
PDF, 86 KB
english, 2010