[IEEE 2008 Design, Automation and Test in Europe - Munich,...

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[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Vectorization of Reed Solomon Decoding and Mapping on the EVP

Kumar, Akash, van Berkel, Kees
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Year:
2008
Language:
english
DOI:
10.1109/date.2008.4484722
File:
PDF, 431 KB
english, 2008
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