[IEEE 2006 International Symposium on VLSI Technology, Systems, and Applications - Hsinchu, Taiwan (2006.4.24-2006.4.24)] 2006 International Symposium on VLSI Technology, Systems, and Applications - RF Extrinsic Resistance Extraction Considering Neutral-Body Effect for Partially-Depleted SOI MOSFETs
Wang, Sheng-chun, Su, Pin, Chen, Kun-ming, Lin, Chien-ting, Liang, Victor, Huang, Guo-weiYear:
2006
Language:
english
DOI:
10.1109/vtsa.2006.251102
File:
PDF, 1.02 MB
english, 2006