[IEEE 2007 American Control Conference - New York, NY, USA...

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[IEEE 2007 American Control Conference - New York, NY, USA (2007.07.9-2007.07.13)] 2007 American Control Conference - Parametric identification using photothermal data inversion: application to a nonlinear thermal system

Gillet, Mathieu, Autrique, Laurent, Perez, Laetitia, Serra, Jean-Jacques
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Year:
2007
Language:
english
DOI:
10.1109/acc.2007.4282606
File:
PDF, 630 KB
english, 2007
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