[IEEE 2009 Canadian Conference on Electrical and Computer...

  • Main
  • [IEEE 2009 Canadian Conference on...

[IEEE 2009 Canadian Conference on Electrical and Computer Engineering (CCECE) - St. John's, NL, Canada (2009.05.3-2009.05.6)] 2009 Canadian Conference on Electrical and Computer Engineering - Experimental validation of statistical algorithm for diagnosis of damage fault

Kumar, Amar, Nayak, Amiya, Srivastava, Alka, Goel, Nita
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2009
Language:
english
DOI:
10.1109/ccece.2009.5090217
File:
PDF, 1.40 MB
english, 2009
Conversion to is in progress
Conversion to is failed