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[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - The development of a low cost digital spinneret inspection system

Chen, Chun-Jen, Jywe, Wenyuh, Hung, Min-Wei, Lin, Chien-Liang, Hung, Jeffery, Lin, Terry
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Year:
2010
Language:
english
DOI:
10.1109/imtc.2010.5488267
File:
PDF, 1.24 MB
english, 2010
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