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[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Effects of gate to drain capacitance to the AC characteristics of trench power MOSFET
Pan, Shaohui, He, Lunwen, Wang, L.K., Zhang, DavidYear:
2006
Language:
english
DOI:
10.1109/icsict.2006.306177
File:
PDF, 173 KB
english, 2006