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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Spectral resolution of photon emission from SiGe:C heterojunction bipolar transistors (HBTs)
Kindereit, Ulrike, Mutihac, Oana-Mihaela, Boit, Christian, Tillack, BerndYear:
2011
Language:
english
DOI:
10.1109/irps.2011.5784527
File:
PDF, 841 KB
english, 2011