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[IEEE International Test Conference 1992 - Baltimore, MD (Sept. 20-24 1992)] Proceedings International Test Conference 1992 - Sequential Redundancy Identification Using Verification Techniques
Moondanos, J., Abraham, J.Year:
1992
Language:
english
DOI:
10.1109/test.1992.527820
File:
PDF, 840 KB
english, 1992