[IEEE 2013 IEEE/AIAA 32nd Digital Avionics Systems Conference (DASC) - East Syracuse, NY, USA (2013.10.5-2013.10.10)] 2013 IEEE/AIAA 32nd Digital Avionics Systems Conference (DASC) - Automatic generation of test cases for critical systems based on MC/DC criteria
Almeida, Mateus Andrade, de Melo Bezerra, Juliana, Hirata, Celso MassakiYear:
2013
Language:
english
DOI:
10.1109/dasc.2013.6712642
File:
PDF, 263 KB
english, 2013