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[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Fault localization using infra-red lock-in thermography for SOI-based advanced microprocessors
Tan, M.C., Tay, M.Y., Qiu, W., Phoa, S.L.Year:
2011
Language:
english
DOI:
10.1109/ipfa.2011.5992753
File:
PDF, 1.25 MB
english, 2011