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[IEEE 2010 International Conference on Computing, Communication and Networking Technologies (ICCCNT'10) - Karur, India (2010.07.29-2010.07.31)] 2010 Second International conference on Computing, Communication and Networking Technologies - Satisfiability based test generation for stuck-at fault coverage in RTL circuits using VHDL

Murugesan, Shenbagapriya, Ranjithkumar, P
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Year:
2010
Language:
english
DOI:
10.1109/icccnt.2010.5591856
File:
PDF, 164 KB
english, 2010
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