[IEEE 2014 IEEE International Conference on Consumer Electronics (ICCE) - Las Vegas, NV, USA (2014.01.10-2014.01.13)] 2014 IEEE International Conference on Consumer Electronics (ICCE) - Scene analysis assisting for AWB using binary decision trees and average image metrics
Sofeikov, K. I., Romanenko, I. V., Tyukin, I. Yu., Gorban, A. N.Year:
2014
Language:
english
DOI:
10.1109/icce.2014.6776095
File:
PDF, 1.00 MB
english, 2014