[IEEE Conference Record AUTOTESTCON '92: The IEEE Systems...

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[IEEE Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference - Dayton, OH, USA (21-24 Sept. 1992)] Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference - TPS-X-an automated graphical approach to TPS design

Cashar, E.E., Walimaa, S.J.
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Year:
1992
Language:
english
DOI:
10.1109/autest.1992.270115
File:
PDF, 483 KB
english, 1992
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