Seamless test of digital components in mixed-signal paths

IEEE Design & Test of Computers 2004 / 01 Vol. 21; Iss. 1

Seamless test of digital components in mixed-signal paths

Ozev, S., Bayraktaroglu, I., Orailoglu, A.
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Volume:
21
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/mdt.2004.1261849
Date:
January, 2004
File:
PDF, 408 KB
english, 2004
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