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Nanobattery Effect in RRAMs—Implications on Device Stability and Endurance
Tappertzhofen, Stefan, Linn, Eike, Bottger, Ulrich, Waser, Rainer, Valov, IliaVolume:
35
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2292113
Date:
February, 2014
File:
PDF, 1.46 MB
english, 2014