[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Evaluation methodology for random telegraph noise effects in SRAM arrays
Yamaoka, M., Miki, H., Bansal, A., Wu, S., Frank, D. J., Leobandung, E., Torii, K.Year:
2011
Language:
english
DOI:
10.1109/iedm.2011.6131656
File:
PDF, 686 KB
english, 2011