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[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Haar Random Forest Features and SVM Spatial Matching Kernel for Stonefly Species Identification
Larios, N., Soran, B., Shapiro, L.G., Martinez-Munoz, G., Lin, J., Dietterich, T.G.Year:
2010
Language:
english
DOI:
10.1109/icpr.2010.643
File:
PDF, 644 KB
english, 2010