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[IEEE 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Las Vegas, NV, USA (2010.06.2-2010.06.5)] 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems - Thermo-mechanical reliability of SAC leadfree alloys
Lall, Pradeep, Hinshaw, Robert, Pandher, Ranjit, Harsha, Mahendra, Suhling, JeffYear:
2010
Language:
english
DOI:
10.1109/itherm.2010.5501303
File:
PDF, 1.08 MB
english, 2010