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[IEEE 2013 International Symposium on Electronic System Design (ISED) - Singapore (2013.12.10-2013.12.12)] 2013 International Symposium on Electronic System Design - Lifetime Reliability-Aware Checkpointing Mechanism: Modelling and Analysis
Bandan, Mohamad Imran Bin, Bhattacharjee, Subhasis, Shafik, Rishad A., Pradhan, Dhiraj K., Mathew, JimsonYear:
2013
Language:
english
DOI:
10.1109/ised.2013.32
File:
PDF, 288 KB
english, 2013