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[IEEE 2010 Ninth IEEE Sensors Conference (SENSORS 2010) - Kona, HI (2010.11.1-2010.11.4)] 2010 IEEE Sensors - Stress distribution under electroless nickel bumps extracted using arrays of 7
Lemke, Benjamin, Baskaran, Rajashree, Ganapathysubramanian, Shankar, Paul, OliverYear:
2010
Language:
english
DOI:
10.1109/icsens.2010.5690152
File:
PDF, 1.58 MB
english, 2010