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[IEEE LEOS 2008 - 21st Annual Meeting of the IEEE Lasers and Electro-Optics Society (LEOS 2008) - Newport Beach, CA, USA (2008.11.9-2008.11.13)] LEOS 2008 - 21st Annual Meeting of the IEEE Lasers and Electro-Optics Society - Decay of radiation pattern and spectrum of high-power LED modules in aging test
Tsai, C.C., Hsu, Y.C., Chen, M.H., Lo, Y.T., Lin, Y.J., Kuang, JH., Hu, H.L., Huang, S.B., Lee, C.W., Su, Y.I., Cheng, W.H.Year:
2008
Language:
english
DOI:
10.1109/leos.2008.4688790
File:
PDF, 158 KB
english, 2008