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[IEEE International Technical Digest on Electron Devices Meeting - Washington, DC, USA (3-6 Dec. 1989)] International Technical Digest on Electron Devices Meeting - A high-performance sub-half micron CMOS technology for fast SRAMs
Hayden, J., Baker, F., Ernst, S., Jones, B., Klein, J., Lien, M., McNelly, T., Mele, T., Mendez, H., Nguyen, B.Y., Parrillo, L., Paulson, W., Pfiester, J., Pintchovski, F., See, Y., Sivan, R., Somero,Year:
1989
Language:
english
DOI:
10.1109/iedm.1989.74311
File:
PDF, 346 KB
english, 1989