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XPS and AES Studies on the Oxidation of Layered Semiconductor GaSe
Iwakuro, Hiroaki, Tatsuyama, Chiei, Ichimura, ShojiVolume:
21
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.21.94
Date:
January, 1982
File:
PDF, 873 KB
1982