[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - On the AC random telegraph noise (RTN) in MOS devices: An improved multi-phonon based model
Gong, Nanbo, Wang, Runsheng, Liu, Changze, Zou, Jibin, Huang, RuYear:
2012
Language:
english
DOI:
10.1109/icsict.2012.6467653
File:
PDF, 5.58 MB
english, 2012