[IEEE 2006 IEEE Region 5 Conference - San Antonio, TX, USA (2006.04.7-2006.04.9)] 2006 IEEE Region 5 Conference - Gate leakage current analysis in READ/WRITE/ IDLE states of a SRAM cell
Mukherjee, Valmiki, Mohanty, Saraju P., Kougianos, Elias, Allawadhi, Rahul, Velagapudi, RamakrishnaYear:
2006
Language:
english
DOI:
10.1109/tpsd.2006.5507432
File:
PDF, 177 KB
english, 2006