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[IEEE 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Atlanta, GA, USA (2011.10.9-2011.10.11)] 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Experimental extraction of the base resistance of SiGe:C HBTs beyond BVCEO: An improved technique
Costagliola, M., d'Alessandro, V., Celi, D., Chantre, A., Chevalier, P., Meister, T., Aufinger, K., Rinaldi, N.Year:
2011
Language:
english
DOI:
10.1109/bctm.2011.6082778
File:
PDF, 290 KB
english, 2011