Time-of-flight-secondary ion mass spectrometry of NaBF4: a...

Time-of-flight-secondary ion mass spectrometry of NaBF4: a comparison of atomic and polyatomic primary ions at constant impact energy

M. J. Van Stipdonk, R. D. Harris, E. A. Schweikert
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Volume:
11
Year:
1997
Language:
english
Pages:
5
DOI:
10.1002/(sici)1097-0231(19971030)11:163.0.co;2-l
File:
PDF, 122 KB
english, 1997
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