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[IEEE 2008 IEEE 68th Vehicular Technology Conference (VTC 2008-Fall) - Calgary, Canada (2008.09.21-2008.09.24)] 2008 IEEE 68th Vehicular Technology Conference - Performance Evaluation of TCAM Based Pattern-Matching Algorithm
Sung, Jung-Sik, Kwon, Taeck-Geun, Huh, JaedooYear:
2008
Language:
english
DOI:
10.1109/vetecf.2008.166
File:
PDF, 585 KB
english, 2008