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[IEEE APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) - Macao, China (2008.11.30-2008.12.3)] APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems - On the approximation errors in the frequency test included in the NIST SP800-22 statistical test suite
Pareschi, Fabio, Rovatti, Riccardo, Setti, GianlucaYear:
2008
Language:
english
DOI:
10.1109/apccas.2008.4746245
File:
PDF, 369 KB
english, 2008