A Comparative Study of Characterization Techniques for...

IEEE Transactions on Device and Materials Reliability 2004 / 09 Vol. 4; Iss. 3

A Comparative Study of Characterization Techniques for Oxide Reliability in Flash Memories

Ielmini, D., Spinelli, A.S., Lacaita, A.L., vanDuuren, M.J.
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Volume:
4
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2004.836719
Date:
September, 2004
File:
PDF, 429 KB
english, 2004
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