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[IEEE 2010 Conference on Precision Electromagnetic Measurements (CPEM 2010) - Daejeon, Korea (South) (2010.06.13-2010.06.18)] CPEM 2010 - Status of the na determination by counting atoms in silicon crystals
Becker, P., Bettin, H., Borys, M., Busch, I., Fujii, K., Gray, M., Krum, M., Kuetgens, U., Mana, G., Manson, P., Massa, E., Nicolaus, A., Picard, A., Schiel, D., Valkiers, S.Year:
2010
Language:
english
DOI:
10.1109/cpem.2010.5544257
File:
PDF, 218 KB
english, 2010