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[IEEE 2014 IEEE Aerospace Conference - Big Sky, MT, USA (2014.3.1-2014.3.8)] 2014 IEEE Aerospace Conference - Heavy ion test results of RHBD standard cells and memory in a 110nm bulk CMOS process
Cameron, Eric, Miles, Lowell, Whitaker, Sterling, Maki, Gary, Shreve, MattYear:
2014
Language:
english
DOI:
10.1109/aero.2014.6836526
File:
PDF, 604 KB
english, 2014