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[IEEE 2010 IEEE 3rd International Nanoelectronics Conference (INEC) - Hong Kong, China (2010.01.3-2010.01.8)] 2010 3rd International Nanoelectronics Conference (INEC) - Variable range hopping conduction in n-Si NWs with focus-ion-beam-induced amorphization
Ke, Jr-Jian, He, Jr-HauYear:
2010
Language:
english
DOI:
10.1109/inec.2010.5424990
File:
PDF, 1.86 MB
english, 2010