Low-Temperature Behavior of the Threshold Current and...

Low-Temperature Behavior of the Threshold Current and Carrier Lifetime of InGaAsP–InP DH Lasers

Horikoshi, Yoshiji, Saito, Hisao, Kawashima, Minoru, Takanashi, Yoshifumi
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Volume:
18
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.18.1657
Date:
August, 1979
File:
PDF, 336 KB
1979
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