Low-Temperature Behavior of the Threshold Current and Carrier Lifetime of InGaAsP–InP DH Lasers
Horikoshi, Yoshiji, Saito, Hisao, Kawashima, Minoru, Takanashi, YoshifumiVolume:
18
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.18.1657
Date:
August, 1979
File:
PDF, 336 KB
1979