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Determination of nanometric Ag 2 O film thickness by surface plasmon resonance and optical waveguide mode coupling techniques
Santillán, Jesica M J, Scaffardi, Lucía B, Schinca, Daniel C, Videla, Fabián AVolume:
12
Language:
english
Journal:
Journal of Optics
DOI:
10.1088/2040-8978/12/4/045002
Date:
April, 2010
File:
PDF, 839 KB
english, 2010