Ultrafast optoelectronic technology for radio metrology...

Journal of Systems Engineering and Electronics (IEEE) 2010 / 6 Vol. 21; Iss. 3

Ultrafast optoelectronic technology for radio metrology applications

Ma, Zhe, Ma, Hongrnei, Gong, Pengwei, Yang, Chuntao, Feng, Kerning
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Volume:
21
Language:
english
Journal:
Journal of Systems Engineering and Electronics
DOI:
10.3969/j.issn.1004-4132.2010.03.017
Date:
June, 2010
File:
PDF, 1.08 MB
english, 2010
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