On measures of dissimilarity between point patterns:...

On measures of dissimilarity between point patterns: Classification based on prototypes and multidimensional scaling

Mateu, Jorge, Schoenberg, Frederic P., Diez, David M., González, Jonatan A., Lu, Weipeng
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Volume:
57
Language:
english
Journal:
Biometrical Journal
DOI:
10.1002/bimj.201300150
Date:
March, 2015
File:
PDF, 1.18 MB
english, 2015
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