[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou,...

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[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou, China (2014.11.16-2014.11.19)] 2014 IEEE 23rd Asian Test Symposium - Advanced Analysis of Cell Stability for Reliable SRAM PUFs

Hosey, Alison, Rahman, Md. Tauhidur, Xiao, Kan, Forte, Domenic, Tehranipoor, Mohammad
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Year:
2014
DOI:
10.1109/ats.2014.70
File:
PDF, 3.19 MB
2014
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