[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou, China (2014.11.16-2014.11.19)] 2014 IEEE 23rd Asian Test Symposium - Advanced Analysis of Cell Stability for Reliable SRAM PUFs
Hosey, Alison, Rahman, Md. Tauhidur, Xiao, Kan, Forte, Domenic, Tehranipoor, MohammadYear:
2014
DOI:
10.1109/ats.2014.70
File:
PDF, 3.19 MB
2014