[IEEE 2010 Design, Automation & Test in Europe...

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[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Memory testing with a RISC microcontroller

van de Goor, Ad, Gaydadjiev, Georgi, Hamdioui, Said
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Year:
2010
Language:
english
DOI:
10.1109/date.2010.5457210
File:
PDF, 246 KB
english, 2010
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