[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Memory testing with a RISC microcontroller
van de Goor, Ad, Gaydadjiev, Georgi, Hamdioui, SaidYear:
2010
Language:
english
DOI:
10.1109/date.2010.5457210
File:
PDF, 246 KB
english, 2010