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[IEEE 1994 IEEE International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1994)] Proceedings of 1994 IEEE International Electron Devices Meeting - Model for 1/f noise in MOSFETs and interconnects
Wolters, D.R., Zegers-van Duijnhoven, A.T.A., Augur, R.Year:
1994
Language:
english
DOI:
10.1109/iedm.1994.383436
File:
PDF, 306 KB
english, 1994