Visualization of Single Atomic Steps on An Ultra-Flat Si(100) Surface by Advanced Differential Interference Contrast Microscopy
Kobayashi, Shin-Ichiro, Kim, Youn-Geun, Wen, Rui, Yasuda, Kohei, Fukidome, Hirokazu, Suwa, Tomoyuki, Kuroda, Rihito, Li, Xiang, Teramoto, Akinobu, Ohmi, Tadahiro, Itaya, KingoVolume:
14
Year:
2011
Language:
english
Journal:
Electrochemical and Solid-State Letters
DOI:
10.1149/1.3597657
File:
PDF, 3.54 MB
english, 2011