[IEEE Instruments (ICEMI) - Beijing, China (2009.08.16-2009.08.19)] 2009 9th International Conference on Electronic Measurement & Instruments - De-noising based on wavelet analysis and bayesian estimation for low-dose X-ray CT
Fang, Ye, Zhou, Yabin, Ge, Dongwei, Zhou, ZhanYear:
2009
Language:
english
DOI:
10.1109/icemi.2009.5274424
File:
PDF, 201 KB
english, 2009