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[IEEE Instruments (ICEMI) - Beijing, China (2009.08.16-2009.08.19)] 2009 9th International Conference on Electronic Measurement & Instruments - De-noising based on wavelet analysis and bayesian estimation for low-dose X-ray CT

Fang, Ye, Zhou, Yabin, Ge, Dongwei, Zhou, Zhan
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Year:
2009
Language:
english
DOI:
10.1109/icemi.2009.5274424
File:
PDF, 201 KB
english, 2009
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