Characteristics of phase transition in boron-implanted Ge...

Surface and Interface Analysis 2014 / 12 Vol. 46; Iss. 12-13

Characteristics of phase transition in boron-implanted Ge 2 Sb 2 Te 5 thin films for phase change memory applications

Chao, D. S., Lee, P. H., Liang, J. H., Chang, P. C., Chin, T. S.
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Volume:
46
Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.5603
Date:
December, 2014
File:
PDF, 474 KB
english, 2014
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