[IEEE Fourth International Conference on Machine Learning and Applications (ICMLA'05) - Los Angeles, CA, USA (15-17 Dec. 2005)] Fourth International Conference on Machine Learning and Applications (ICMLA'05) - On The Discovery of Semantically Enhanced Sequential Patterns
Adda, M., Valtchev, P., Missaoui, R., Djeraba, C.Year:
2005
Language:
english
DOI:
10.1109/icmla.2005.49
File:
PDF, 314 KB
english, 2005