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[IEEE 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Hong Kong, China (2008.01.23-2008.01.25)] 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Test Set Stripping Limiting the Maximum Number of Specified Bits
Kochte, Michael A., Zoellin, Christian G., Imhof, Michael E., Wunderlich, Hans-JoachimYear:
2008
Language:
english
DOI:
10.1109/delta.2008.64
File:
PDF, 476 KB
english, 2008