Optimization of optical lens-controlled scanning electron...

Optimization of optical lens-controlled scanning electron microscopic resolution using generalized regression neural network and genetic algorithm

Byungwhan Kim, Sanghee Kwon, Dong Hwan Kim
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Volume:
37
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.eswa.2009.05.007
File:
PDF, 904 KB
english, 2010
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