[IEEE 2013 8th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) - Taipei, Taiwan (2013.10.22-2013.10.25)] 2013 8th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) - A new detection method for the onset of PCB pad cratering
Chang, Graver, Chen, Mark, Lee, Dem, Lee, Jeffrey, Ramakrishna, Gnyaneshwar, Oliver, Jennifer, Chou, TacioYear:
2013
Language:
english
DOI:
10.1109/impact.2013.6706655
File:
PDF, 904 KB
english, 2013