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[IEEE 2013 IEEE 13th International Conference on Nanotechnology (IEEE-NANO) - Beijing, China (2013.08.5-2013.08.8)] 2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO 2013) - Experimental study on electrical properties and stability of CNT bumps in high density interconnects
Zhang, Yan, Zhou, Ying-jie, Fan, Jing-yu, Jiang, Di, Fu, Yifeng, Ma, Shi-wei, Liu, JohanYear:
2013
Language:
english
DOI:
10.1109/nano.2013.6720972
File:
PDF, 235 KB
english, 2013